High Resolution Field Emission Gun Transmission Electron Microscope (HR FEG-TEM) 200kV

The ideal machine for conventional and high-end TEM characterization of a wide range of samples, from hard-matter applications to organics and life sciences. This TEM is equipped with a high-brilliance Schottky field emission gun (FEG), hosts different kinds of detectors and is designed for operating in flexible experimental set-ups. It can deliver high-resolution TEM and STEM imaging, state-of-the-art electron diffraction and high-throughput chemical analyses.
JEOL JEM-F200 is thought to strength the potentials of all the scientific branches of the University of Pisa and to become a reference for local and national Research Institutions and innovative companies.

Conventional and biological TEM applications

> Possibility to switch from 80 kV for biological imaging to 200 kV for material sciences applications;
> Automatic sample insertion and cryo-trap for speeding sample loading and unloading;
> High-tilt (± 80°) capability for 3D TEM and STEM tomographic acquisitions;
> Analytical double-tilt holder for sample orientation and quantitative EDX measurements;
> CCD camera for remote control and green screen visualization;
> Bottom-mounted high-speed GATAN Rio16 camera (4k x 4k pixels; up to 160 fps) and DigitalMicrograph software for optimal image acquisition and analysis.

High-resolution TEM and STEM

> Almost atomic resolution in both TEM and STEM configuration, with high performances guaranteed by the FEG source;
> Resolution in TEM of about 0.23 nm, with maximum magnification 2,000,000x and possibility of studying crystal defects and interfaces;
> Resolution in STEM of about 0.16 nm, with possibility of four different detectors: dark-field, bright-field, backscattered electrons and secondary electrons.

Electron Diffraction

> Possibility of conventional selected area, nano-probe and convergent electron diffraction;
> Ultra-fast and ultra-sensitive ASI CheeTah hybrid single-electron detector with zero-time read-out (500 x 500 pixel, more than 2000 fps), designed for performing low-dose diffraction on extremely beam-sensitive materials;
> NANOMEGAS Topspin digital controller for beam precession, able to minimize dynamical scattering in oriented electron diffraction patterns;
> Routines for acquiring 3D data sets for ab-initio structure determination and refinement from sub-micrometric organic and inorganic crystals;
> Nanomegas 4D STEM system and external camera for the collection of phase, orientation and strain maps at nanometric resolution.

Energy Dispersive X-ray spectroscopy (EDX)

> STEM-controlled nano-probe, with possibility of quantitative punctual chemical analysis, chemical profiles and chemical mapping (with possibility of drift correction);
> High-gain silicon drift detector for high-throughput and fast acquisitions, with possibility to detect elements from Be to U.