The ideal machine for conventional and high-end TEM characterization of a wide range of samples, from hard-matter applications to organics and life sciences. This TEM is equipped with a high-brilliance Schottky field emission gun (FEG), hosts different kinds of detectors and is designed for operating in flexible experimental set-ups. It can deliver high-resolution TEM and STEM imaging, state-of-the-art electron diffraction and high-throughput chemical analyses.
JEOL JEM-F200 is thought to strength the potentials of all the scientific branches of the University of Pisa and to become a reference for local and national Research Institutions and innovative companies.
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2 May 2024
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27 May 2024
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28 May 2024
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29 May 2024
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30 May 2024
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31 May 2024
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1 June 2024
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