The ideal machine for conventional and high-end TEM characterization of a wide range of samples, from hard-matter applications to organics and life sciences. This TEM is equipped with a high-brilliance Schottky field emission gun (FEG), hosts different kinds of detectors and is designed for operating in flexible experimental set-ups. It can deliver high-resolution TEM and STEM imaging, state-of-the-art electron diffraction and high-throughput chemical analyses.
JEOL JEM-F200 is thought to strength the potentials of all the scientific branches of the University of Pisa and to become a reference for local and national Research Institutions and innovative companies.
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19 April 2024
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20 April 2024
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22 April 2024
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18 May 2024
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19 May 2024
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