AFM Nanoscope Veeco – Nanoscope IV

The Atomic Force Microscope (AFM Veeco, Nanoscope IV), equipped with Multimode and Picoforce, is a very high-resolution type of scanning probe microscope, with demonstrated resolution of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The primary use of our AFMs is for high spatial resolution imaging of surfaces. A sharp probe is rastered over the sample surface as laser light is reflected off the back side of the probe. The deflection of the light is measured as it moves over the surface of the sample and provides the researcher with an image of the material. We also have the ability to do high sensitivity force (indentation and pulling) experiments with our AFMs.

Features & Info sheet:
– Scan from 0.4µ laterally (x and y axes) and 0.4µ vertically (z axis) up to 200µ laterally and 10µ vertically.
– Calibration and linearization are maintained by software control.
– 16-bit resolution on all three axes, with three independent 16-bit digital-to-analog converters (DACs)

Options:
– Contact Mode AFM: Measures topography by sliding the probe tip across the sample surface;
– TappingModeT AFM: Measures topography by “tapping” the surface with an oscillating probe tip;
– Phase Imaging: Provides contrast caused by differences in surface adhesion and viscoelasticity;
– Non-contact AFM: Measures topography by sensing attractive forces between the surface and the probe tip;
– Force Modulation: Measures relative elasticity/stiffness of surface features.