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The FEI Quanta 450 FEG of CISUP is a field emission gun – scanning electron microscope (FEG-SEM) used for high-resolution imaging (morphological and compositional) of both conductive and non-conductive specimens at the nanometer-scale resolution (magnification range: from 6 x to 1,000,000 x) and for semi-quantitative X-ray microanalysis. The instrument operates under three imaging modes: high and low vacuum and extended low vacuum modes. The instrument can thus accommodate multiple sample, imaging and analytical requirements for both material and life sciences, allowing investigation of a wide range of traditional and non-traditional samples with or without preparation, including wet samples in their natural state. The coherent high current density (brightness) electron beam delivered by the thermally assisted field emission gun (FEG) enables high imaging resolution down to ~1 nm.