cherubino

Field-emission scanning electron microscope FEI ESEM-FEG Quanta 450 and High vacuum sputter and C-thread coater LEICA EM ACE 600

The FEI Quanta 450 FEG ESEM can accommodate multiple sample and imaging requirements for industrial process control labs, materials science labs and life science labs. Featuring three imaging modes – high vacuum, low vacuum and ESEMTM, it accommodates the widest range of samples of any SEM system. These instruments are engineered to provide maximum data – imaging and microanalysis – from all specimens, with or without preparation. Characterization of both traditional samples from metals, fractures and polished sections, to non-conductive soft materials.

Back to top